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并联二极管的测试
日期：2024-11-18 19:55
浏览次数：4328
摘要：
并联二极管的ICT测试
关联二极管并联的情况；
1，二极管同向并闻，如IC并联，则是反向二极管同向并联
2，二极管反向并联
3，二极管与三极管并联
二极管同向关联如下图：
测试方法
1，测试同向电流
2，测试IC SCAN
3，使用HP TESTJET测试
具体程序
1，ICT测试同向电流
C Step Device LC STDval ACTvalUN +% -% MD RG DY A B Guard pins
======= ============ == ====== ======== === === == == == ==== ==== ============
1 D1//D2 A1 50MA 1.0V 20 20 CM 2 1 2 0
2,ic scan测试法
C Step Device LC STDval ACTvalUN +% -% MD RG DY A B Guard pins
======= ============ == ====== ======== === === == == == ==== ==== ============
1 D1//D2 A1 100MA 1.5v 20 20 IS 2 1 2 3
3,HP TESTJET测试法
C Step Device LC STDval ACTvalUN +% -% MD RG DY A B Guard pins
======= ============ == ====== ======== === === == == == ==== ==== ============
1 D1 A1 0 200MV 30 30 TJ 0 0 1 1 0
2 D2 A1 0 200MV 30 30 Tj 0 0 2 1 0
其中B点为TESTJET感应器编号，A点为连接二极管的脚，此方法为IC上的保护二极体并联
二极管反向并测试方法
测试反向两个电压
C Step Device LC STDval ACTvalUN +% -% MD RG DY A B Guard pins
======= ============ == ====== ======== === === == == == ==== ==== ============
1 D1//D2 A1 0 0.7v 30 30 DT 0 0 1 2 0
1 D1//D2 A1 0 0.7v 30 30 DT 0 0 2 1 0
并联二极管的测试
